These documents cover the physical architecture of the tester.
#include "testmethod.hpp" #include "SharedUserInterface.h" class FunctionalTestWithPMU : public testmethod::TestMethod { protected: string mPinList; double mSettleTime; protected: virtual void initialize() { // Bind local variables to the SmarTest parameter UI addParameter("pinList", "string", &mPinList); addParameter("settleTime", "double", &mSettleTime); } virtual void run() { // 1. Initialize the functional burst ON_FIRST_INVOCATION { DMM_MAIN_BCAST_ON; } // 2. Route PMU to pins and measure current try { PRIMARY_PRES_PIN_VEC.clear(); // Execute functional pattern burst FLUSH_AND_WAIT(); // Output results to the datalogger PUT_DATALOG_VALUE("Meas_Current", 1.25, "mA", TM::PASS); } catch (Error& err) { SET_ERROR_STATUS(err.to_string()); } } }; REGISTER_TESTMETHOD("FunctionalTestWithPMU", FunctionalTestWithPMU); Use code with caution. SmarTest 8 Java Test Method Template advantest 93k tester manual
Defines the test clock periods, edge placements, and waveform formats (e.g., Return-to-Zero, Non-Return-to-Zero). Levels File (.lev): Sets the operating voltages, including VIHcap V sub cap I cap H end-sub (Input High), VILcap V sub cap I cap L end-sub (Input Low), VOHcap V sub cap O cap H end-sub (Output High Level), and VOLcap V sub cap O cap L end-sub (Output Low Level), alongside power supply limits. These documents cover the physical architecture of the
Checks for open or short circuits on the ESD diodes of the DUT. Leakage Tests ( Route PMU to pins and measure current try
These documents cover the physical architecture of the tester.
#include "testmethod.hpp" #include "SharedUserInterface.h" class FunctionalTestWithPMU : public testmethod::TestMethod { protected: string mPinList; double mSettleTime; protected: virtual void initialize() { // Bind local variables to the SmarTest parameter UI addParameter("pinList", "string", &mPinList); addParameter("settleTime", "double", &mSettleTime); } virtual void run() { // 1. Initialize the functional burst ON_FIRST_INVOCATION { DMM_MAIN_BCAST_ON; } // 2. Route PMU to pins and measure current try { PRIMARY_PRES_PIN_VEC.clear(); // Execute functional pattern burst FLUSH_AND_WAIT(); // Output results to the datalogger PUT_DATALOG_VALUE("Meas_Current", 1.25, "mA", TM::PASS); } catch (Error& err) { SET_ERROR_STATUS(err.to_string()); } } }; REGISTER_TESTMETHOD("FunctionalTestWithPMU", FunctionalTestWithPMU); Use code with caution. SmarTest 8 Java Test Method Template
Defines the test clock periods, edge placements, and waveform formats (e.g., Return-to-Zero, Non-Return-to-Zero). Levels File (.lev): Sets the operating voltages, including VIHcap V sub cap I cap H end-sub (Input High), VILcap V sub cap I cap L end-sub (Input Low), VOHcap V sub cap O cap H end-sub (Output High Level), and VOLcap V sub cap O cap L end-sub (Output Low Level), alongside power supply limits.
Checks for open or short circuits on the ESD diodes of the DUT. Leakage Tests (