On-chip LFSR (Linear Feedback Shift Register) generates vectors; MISR (Multiple Input Signature Register) compacts responses.
| Fault Model | Description | Detection Method | |-------------|-------------|------------------| | Stuck-at (SA0/SA1) | Signal permanently 0 or 1 | Path sensitization | | Transition Delay | Signal fails to change fast enough | At-speed test | | Bridging | Short between two nodes | IDDQ or logic test | | Open | Disconnected net | Voltage/timing test | Share public link Standard flip-flops are replaced with
Scan Architecture: Maximizing Controllability and Observability and a scan-enable control line.
Testing every unique combination of inputs in a complex digital system is mathematically impossible. For a simple 64-bit adder, testing all input combinations would require 21282 to the 128th power commercial consumer electronics
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Standard flip-flops are replaced with multiplexed flip-flops containing a regular data input, a scan-input, and a scan-enable control line.